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More Published Papers:

	Analog / Mixed-Signal / RF
	Custom IC CAD
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Published Papers

Custom IC CAD

The full text of most of these papers may be found at the IEEE website at www.ieee.org.

G. Vakanas, S. Munir, E.Tejnil, D. Bald, R. Nagpal
"Lithography-based automation in the Design of Program Defect Masks"
Proc. SPIE Feb. 2004