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VWFVIRTUAL WAFER FABVWF is software used for performing Design of Experiments (DOE) and Optimization Experiments. Split-lots can be used in various pre-defined analysis methods. Split parameters can be defined for any of Silvaco’s process, device, parasitic extraction and circuit simulators. All simulations can be carried out in parallel either on a cluster of workstations or on a single SMP machine. VWF comes with a GUI, that also enables examination of experimental results. Key Features
Database Manager
![]() Input decks can be loaded from files, or pasted from another directory
in the same database or imported from another database.
Split-Lot Manager
![]() Access experiments through an explorer or tree view graphic.
![]() Split parameters are defined graphically for any type of simulator.
Experimental Design Generator
![]() Design of Experiment Generator. The DoE is selected from the pull down menu.
Scripting Interface
![]() JavaScript editor displaying an advanced Latin-Hypercube algorithm.
![]() Defining a shared library to load.
Network Job Controller
![]() Set up CPU numbers on multi-CPU machine when Oracle Grid Engine is not used.
![]() Grid-Engine Cluster Configuration.
Split Plot Worksheet
![]() Drain Current vs. Gate Voltage shown for 4 different process parameter combinations. Curves correspond to the selected cells 8.2, 8.5, 8.6, and 8.9 (red, green, dark blue, light blue).
Interactive Worksheet Editor
![]()
Security Features
![]() Security dialog showing several groups and users.
Powerful Import/Export Capabilities
![]() Experiment tutorial_01 is exported to a zipped TAR file. The result can directly be opened in VWF filemode or the file can be imported into another database.
![]() Importing a single TAR file.
![]() Importing several TAR files in batch mode.
![]() Importing CSV file to define a DOE.
![]() Importing deck from a CVS repository.
Result Analyzer
![]() ![]() Statistical summary as well as histograms are available in SPAYN for of all variables (i.e process parameter) and corresponding extracted parameter (i.e Ring Oscillator frequency)
![]() Correlation between user selectable parameter is available directly from SPAYN
![]() Yield analysis with user selectable statistical distribution. Yield of ring oscillator frequency is shown as a function of different process parameter distribution (i.e. gate oxidation time).
![]() Graphical view of an optimization experiment. In Green the best result that minimize the target.
![]() Optimized process parameters obtained for the targeted experimental Q factor curve.
Rev. 091311_07 |
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